• DocumentCode
    3554272
  • Title

    Temperature-stable MOSFET reference voltage source

  • Author

    Butler, Walter J. ; Eichelberger, Charles W.

  • Author_Institution
    General Electric Company, Schenectady, New York
  • Volume
    22
  • fYear
    1976
  • fDate
    1976
  • Firstpage
    587
  • Lastpage
    589
  • Abstract
    Punchthrough operation of a short-channel MOSFET device to obtain a temperature-stable output voltage is described. The MOSFET is operated as a two-terminal device with its gate, source and substrate connected to ground, and a variable current source connected to its drain. When the voltage that is developed at the drain of the device, Vr, exceeds punchthrough, the sensitivity of Vrto changes in ambient temperature, T, can be minimized at any chosen temperature, Tc, by selecting an appropriate current density, Jopt. For constant Jopt, a deviation of approximately 10 ppM/°C is predicted for Vrover the temperature range from 200 to 300°K. Experimentally, deviations as low as 1 ppM/°C have been measured over a 100°C temperature range.
  • Keywords
    Current density; Dielectric constant; Doping; MOSFET circuits; Neodymium; Permittivity; Silicon; Temperature distribution; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1976 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1976.189113
  • Filename
    1478825