DocumentCode
3554272
Title
Temperature-stable MOSFET reference voltage source
Author
Butler, Walter J. ; Eichelberger, Charles W.
Author_Institution
General Electric Company, Schenectady, New York
Volume
22
fYear
1976
fDate
1976
Firstpage
587
Lastpage
589
Abstract
Punchthrough operation of a short-channel MOSFET device to obtain a temperature-stable output voltage is described. The MOSFET is operated as a two-terminal device with its gate, source and substrate connected to ground, and a variable current source connected to its drain. When the voltage that is developed at the drain of the device, Vr , exceeds punchthrough, the sensitivity of Vr to changes in ambient temperature, T, can be minimized at any chosen temperature, Tc , by selecting an appropriate current density, Jopt . For constant Jopt , a deviation of approximately 10 ppM/°C is predicted for Vr over the temperature range from 200 to 300°K. Experimentally, deviations as low as 1 ppM/°C have been measured over a 100°C temperature range.
Keywords
Current density; Dielectric constant; Doping; MOSFET circuits; Neodymium; Permittivity; Silicon; Temperature distribution; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Type
conf
DOI
10.1109/IEDM.1976.189113
Filename
1478825
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