• DocumentCode
    3554591
  • Title

    A nonlinear CAD model for the depletion-mode IGFET

  • Author

    El-Mansy, Youssef A.

  • Author_Institution
    Bell-Northern Research, Ottawa, Canada
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    20
  • Lastpage
    25
  • Abstract
    Using simple charge-voltage relationships, a four terminal model is developed for the depletion-mode IGFET. Various conditions, which can co-exist at the surface such as accumulation, depletion and inversion, are taken into account. The basic model elements, namely the source-drain transport current and the various charging currents, are explicitly given in terms of known processing data. Device parameters essential to device design such as threshold voltage, drain saturation voltage and conditions for surface inversion are directly related to implanted layer characteristics.
  • Keywords
    Atomic layer deposition; Epitaxial growth; Impurities; Ion implantation; MOS devices; P-n junctions; Space charge; Substrates; Surface charging; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189342
  • Filename
    1479767