DocumentCode
3554591
Title
A nonlinear CAD model for the depletion-mode IGFET
Author
El-Mansy, Youssef A.
Author_Institution
Bell-Northern Research, Ottawa, Canada
Volume
24
fYear
1978
fDate
1978
Firstpage
20
Lastpage
25
Abstract
Using simple charge-voltage relationships, a four terminal model is developed for the depletion-mode IGFET. Various conditions, which can co-exist at the surface such as accumulation, depletion and inversion, are taken into account. The basic model elements, namely the source-drain transport current and the various charging currents, are explicitly given in terms of known processing data. Device parameters essential to device design such as threshold voltage, drain saturation voltage and conditions for surface inversion are directly related to implanted layer characteristics.
Keywords
Atomic layer deposition; Epitaxial growth; Impurities; Ion implantation; MOS devices; P-n junctions; Space charge; Substrates; Surface charging; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189342
Filename
1479767
Link To Document