• DocumentCode
    3554614
  • Title

    Moisture determination in hermetic IC packages by the dew point method using AC capacitance and conductance measurement

  • Author

    Sosniak, J. ; Unger, B.A.

  • Author_Institution
    Bell Laboratories, Murray Hill, New Jersey
  • Volume
    24
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    104
  • Lastpage
    107
  • Abstract
    The dew point in ceramic packages is shown to be observable by ac phase-sensitive measurement of the real and imaginary parts of the dielectric constant of an air gap capacitor. Only the package surface directly under the sensor is cooled, enhancing the sensitivity by preferential condensation. The dew point response peak is followed by a sharp drop due to interface freezing phenomena. Milligrams of liquid water had to be placed in the packages before sealing with epoxy at 175°C for dew points above -20°C to been seen. Large amounts of water were thus eliminated even at this moderate temperature.
  • Keywords
    Capacitance measurement; Capacitors; Ceramics; Dielectric constant; Dielectric measurements; Integrated circuit packaging; Moisture measurement; Phase measurement; Sensor phenomena and characterization; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1978 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1978.189363
  • Filename
    1479788