DocumentCode
3554614
Title
Moisture determination in hermetic IC packages by the dew point method using AC capacitance and conductance measurement
Author
Sosniak, J. ; Unger, B.A.
Author_Institution
Bell Laboratories, Murray Hill, New Jersey
Volume
24
fYear
1978
fDate
1978
Firstpage
104
Lastpage
107
Abstract
The dew point in ceramic packages is shown to be observable by ac phase-sensitive measurement of the real and imaginary parts of the dielectric constant of an air gap capacitor. Only the package surface directly under the sensor is cooled, enhancing the sensitivity by preferential condensation. The dew point response peak is followed by a sharp drop due to interface freezing phenomena. Milligrams of liquid water had to be placed in the packages before sealing with epoxy at 175°C for dew points above -20°C to been seen. Large amounts of water were thus eliminated even at this moderate temperature.
Keywords
Capacitance measurement; Capacitors; Ceramics; Dielectric constant; Dielectric measurements; Integrated circuit packaging; Moisture measurement; Phase measurement; Sensor phenomena and characterization; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189363
Filename
1479788
Link To Document