DocumentCode
3554689
Title
Anomalous Gunn and avalanche effects of GaAs MESFET´s
Author
Wang, Patrick H. ; Li, Chiung T. ; Poulin, Dennis ; Richter, Klaus ; Froess, Phil
Author_Institution
Hewlett-Packard Company, Santa Rosa, California
Volume
24
fYear
1978
fDate
1978
Firstpage
377
Lastpage
380
Abstract
Anomalous avalanche and Gunn effect are observed in a one micron gate GaAs FET. Microwave circuit implications and the causes of formation are discussed. Several proven solutions in eliminating these undesired effects are also reported.
Keywords
Avalanche breakdown; Circuit noise; Crystalline materials; Frequency; Gallium arsenide; Gunn devices; MESFETs; Microwave FETs; Microwave circuits; Spectral analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189432
Filename
1479857
Link To Document