Title :
Anomalous Gunn and avalanche effects of GaAs MESFET´s
Author :
Wang, Patrick H. ; Li, Chiung T. ; Poulin, Dennis ; Richter, Klaus ; Froess, Phil
Author_Institution :
Hewlett-Packard Company, Santa Rosa, California
Abstract :
Anomalous avalanche and Gunn effect are observed in a one micron gate GaAs FET. Microwave circuit implications and the causes of formation are discussed. Several proven solutions in eliminating these undesired effects are also reported.
Keywords :
Avalanche breakdown; Circuit noise; Crystalline materials; Frequency; Gallium arsenide; Gunn devices; MESFETs; Microwave FETs; Microwave circuits; Spectral analysis;
Conference_Titel :
Electron Devices Meeting, 1978 International
DOI :
10.1109/IEDM.1978.189432
