DocumentCode
3554770
Title
A new power transistor structure for improved switching performances
Author
Owyang, K. ; Shafer, P.
Author_Institution
General Electric Company, Syracuse, New York
Volume
24
fYear
1978
fDate
1978
Firstpage
667
Lastpage
670
Abstract
The performances of high voltage switching transistors in an inductive circuit are largely determined by the switching loss it incurred and also by the ruggedness to withstand reverse second breakdown. This paper presents an innovative emitter structure which has no adverse effect on static characteristics but provides at least three times improvement in switching loss and 10% improvement in RBSOA. It also has been demonstrated that RBSOA performance can further be enhanced drastically with the use of a multiple epitaxial layer collector structure. This coupled with the new emitter structure constitutes a new transistor structure that has low switching loss and rugged RBSOA performance.
Keywords
Breakdown voltage; Coupling circuits; Epitaxial layers; Inverters; Power semiconductor switches; Power transistors; Semiconductor device breakdown; Semiconductor devices; Switching circuits; Switching loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1978 International
Type
conf
DOI
10.1109/IEDM.1978.189507
Filename
1479932
Link To Document