• DocumentCode
    3554883
  • Title

    Integrated injection logic with extended temperature range capability

  • Author

    Dening, David C. ; Ragonese, Louis J. ; Lee, Stephen C Y

  • Author_Institution
    General Electric Company, Syracuse, New York
  • Volume
    25
  • fYear
    1979
  • fDate
    1979
  • Firstpage
    192
  • Lastpage
    195
  • Abstract
    Silicon I2L devices were designed, fabricated and analyzed. These devices were shown to be fully operational from -55°C to +300°C.
  • Keywords
    Circuits; Conductivity; Immunity testing; Laboratories; Leakage current; Logic devices; Semiconductor device doping; Semiconductor process modeling; Silicon; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1979 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1979.189576
  • Filename
    1480441
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3554883