• DocumentCode
    3555007
  • Title

    A quadruply self-aligned MOS (QSA MOS) a new short channel high speed high density MOSFET for VLSI

  • Author

    Ohta, Kuniichi ; Yamada, Kunio ; Shimizu, Kyozo ; Tarui, Yasuo

  • Author_Institution
    VLSI Technology Research Association, Kawasaki, Japan
  • Volume
    25
  • fYear
    1979
  • fDate
    1979
  • Firstpage
    581
  • Lastpage
    584
  • Abstract
    A new device named Quadruply Self-Aligned (QSA) MOS is proposed to overcome speed and density limit of conventional scaled down MOS VLSI circuits. This device includes four mutually self-aligned areas: poly Si gate area, shallow source drain area to eliminate short channel effect, deep junction area with high conductance and specific contact area to afford efficient metallic interconnection, thus achieving high speed and high density. Fabrication processes involve undercutting of poly Si gate, anisotropic ion etching of SiO2and source drain ion implantation. Experimental results of the device and feasibility of MOS RAM with a density of 1 Mbit/6 × 4 mm2storage area are described.
  • Keywords
    Anisotropic magnetoresistance; Capacitance; Equations; Etching; Fabrication; Integrated circuit interconnections; MOS devices; MOSFET circuits; Oxidation; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1979 Internationa
  • Type

    conf

  • DOI
    10.1109/IEDM.1979.189690
  • Filename
    1480555