DocumentCode

3555174

Title

Elimination of latch up in bulk CMOS

Author

Payne, R.S. ; Grant, W.N. ; Bertram, W.J.

Author_Institution

Analog Devices, Wilmington, Mass.

Volume

26

fYear

1980

fDate

1980

Firstpage

248

Lastpage

251

Keywords

CMOS technology; Charge carrier lifetime; Circuits; Gold; Latches; Microprocessors; Packaging; Semiconductor device measurement; Substrates; Thyristors;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1980 International

Type

conf

DOI

10.1109/IEDM.1980.189806

Filename

1481249