DocumentCode
3555261
Title
InP/InGaAs heterojunction bipolar phototransistors with improved sensitivity
Author
Campbell, J.C. ; Dentai, A.G. ; Burrus, C.A. ; Ferguson, J.F.
Author_Institution
Bell Laboratories, Holmdel, New Jersey
Volume
26
fYear
1980
fDate
1980
Firstpage
526
Lastpage
529
Abstract
The fabrication and device characteristics of back-illuminated InP/InGaAs n-p-n heterojunction phototransistors will be described. These devices consist of a "wide-bandgap" InP emitter with smaller bandgap InGaAs base and collector layers. Uniform spectral response is observed in the wavelength range from 0.95 µm to 1.6 µm. The DC optical gain increases from approximately 40 at an input power of 1 nW to over 1000 for an input power level of 5 µW. The small-signal gain is characteristically 2 to 3 times higher than the EC gain. The cut-off frequency fT is an increasing function of the incident light level; for 1 µW of incident power fT ≃ 300 MHz. The possible applications of these phototransistors in fiber optic systems will be discussed.
Keywords
Cutoff frequency; Heterojunctions; Indium gallium arsenide; Indium phosphide; Optical device fabrication; Optical fibers; Optical sensors; Photonic band gap; Phototransistors; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1980 International
Type
conf
DOI
10.1109/IEDM.1980.189884
Filename
1481327
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