• DocumentCode
    3555261
  • Title

    InP/InGaAs heterojunction bipolar phototransistors with improved sensitivity

  • Author

    Campbell, J.C. ; Dentai, A.G. ; Burrus, C.A. ; Ferguson, J.F.

  • Author_Institution
    Bell Laboratories, Holmdel, New Jersey
  • Volume
    26
  • fYear
    1980
  • fDate
    1980
  • Firstpage
    526
  • Lastpage
    529
  • Abstract
    The fabrication and device characteristics of back-illuminated InP/InGaAs n-p-n heterojunction phototransistors will be described. These devices consist of a "wide-bandgap" InP emitter with smaller bandgap InGaAs base and collector layers. Uniform spectral response is observed in the wavelength range from 0.95 µm to 1.6 µm. The DC optical gain increases from approximately 40 at an input power of 1 nW to over 1000 for an input power level of 5 µW. The small-signal gain is characteristically 2 to 3 times higher than the EC gain. The cut-off frequency fTis an increasing function of the incident light level; for 1 µW of incident power fT≃ 300 MHz. The possible applications of these phototransistors in fiber optic systems will be discussed.
  • Keywords
    Cutoff frequency; Heterojunctions; Indium gallium arsenide; Indium phosphide; Optical device fabrication; Optical fibers; Optical sensors; Photonic band gap; Phototransistors; Stimulated emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1980 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1980.189884
  • Filename
    1481327