• DocumentCode
    3555512
  • Title

    Determination of impact ionization coefficients in InP by analysis of photomultiplication and noise measurements

  • Author

    Bulman, G.E. ; Cook, L.W. ; Tashima, M.M. ; Stillman, G.E.

  • Author_Institution
    University of Illinois, Urbana, IL
  • Volume
    27
  • fYear
    1981
  • fDate
    1981
  • Firstpage
    288
  • Lastpage
    291
  • Abstract
    The electron and hole impact ionization coefficients, α and β, respectively have been determined in InP using specially fabricated devices that permit both pure electron and pure hole injection. Ionization coefficients calculated from photocurrent multiplication data for devices with three different active region doping levels indicate a ratio of β/α which decreases from 4.0 to 1.3 for fields of 2.4 to 7.7 × 105V/cm, respectively. Avalanche noise measurements have been performed on the same devices and the results indicate a value of β/α that is generally consistent with the photocurrent multiplication results.
  • Keywords
    Avalanche photodiodes; Charge carrier processes; Doping; Etching; Impact ionization; Indium phosphide; Laboratories; Noise measurement; Photoconductivity; Pollution measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1981 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1981.190066
  • Filename
    1482019