DocumentCode
3555512
Title
Determination of impact ionization coefficients in InP by analysis of photomultiplication and noise measurements
Author
Bulman, G.E. ; Cook, L.W. ; Tashima, M.M. ; Stillman, G.E.
Author_Institution
University of Illinois, Urbana, IL
Volume
27
fYear
1981
fDate
1981
Firstpage
288
Lastpage
291
Abstract
The electron and hole impact ionization coefficients, α and β, respectively have been determined in InP using specially fabricated devices that permit both pure electron and pure hole injection. Ionization coefficients calculated from photocurrent multiplication data for devices with three different active region doping levels indicate a ratio of β/α which decreases from 4.0 to 1.3 for fields of 2.4 to 7.7 × 105V/cm, respectively. Avalanche noise measurements have been performed on the same devices and the results indicate a value of β/α that is generally consistent with the photocurrent multiplication results.
Keywords
Avalanche photodiodes; Charge carrier processes; Doping; Etching; Impact ionization; Indium phosphide; Laboratories; Noise measurement; Photoconductivity; Pollution measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1981 International
Type
conf
DOI
10.1109/IEDM.1981.190066
Filename
1482019
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