DocumentCode
3555893
Title
High speed-low power GaAs/AlGaAs TEGFET integrated circuit
Author
Linh, Nuyen T. ; Tung, Pham N. ; Delabeaudeuf, D. ; Delescluse, P. ; Laviron, M.
Author_Institution
Thomson-CSF Central Research Laboratory, Orsay, France
Volume
28
fYear
1982
fDate
1982
Firstpage
582
Lastpage
585
Abstract
Two-dimensional electron gas FETs (TEGFETs) have been used to fabricate DCFL circuits. The MBE wafers are processed as-grown without any recessed gate etching nor self-aligned implantation. Source, drain and gate are directly deposited on the wafer to realize enhancement-mode FETs whereas loads are ungated transistors. With delay times of 18.4 and 32.5 ps at 300 K for 0.9 and 0.032 mW respectively, TEGFETis the fastest semiconductor device amd present very low power dissipation. It is shown that these performances are still limited by contact resistance and material quality. Improvements of these parameters will lead to delay time of ∼9 ps at 300 K for 0.7
m gate length. The high performance and the simplicity of the process involved, make the TEGFET very suitable for LSI/VLSI applications.
m gate length. The high performance and the simplicity of the process involved, make the TEGFET very suitable for LSI/VLSI applications.Keywords
Contact resistance; Delay; Etching; FETs; Gallium arsenide; HEMTs; High speed integrated circuits; MODFETs; Power dissipation; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1982 International
Type
conf
DOI
10.1109/IEDM.1982.190359
Filename
1482893
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