DocumentCode :
3556156
Title :
Structure-dependent MOSFET degradation due to hot-electron injection
Author :
Hsu, Fu-Chieh ; Grinolds, Hugh R.
Author_Institution :
Hewlett-Packard Laboratories, Palo Alto, California
Volume :
29
fYear :
1983
fDate :
1983
Firstpage :
742
Lastpage :
744
Keywords :
Degradation; Electrodes; Equivalent circuits; Interface states; Laboratories; MOSFET circuits; Maintenance; Secondary generated hot electron injection; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1983 International
Type :
conf
DOI :
10.1109/IEDM.1983.190616
Filename :
1483741
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3556156
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