• DocumentCode
    3557043
  • Title

    SUPREM 3.5, process modeling of gallium arsenide

  • Author

    Deal, M.D. ; Hansen, S.E. ; Anholt, R. ; Chou, S. ; Plummer, J.D. ; Dutton, R.W. ; Sigmon, T.W. ; Stevenson, D.A. ; Helms, C.R. ; Bravman, J.C.

  • Author_Institution
    Stanford University, Stanford, California
  • Volume
    33
  • fYear
    1987
  • fDate
    1987
  • Firstpage
    256
  • Lastpage
    259
  • Abstract
    A computer program has been developed to simulate processes used to manufacture digital GaAs integrated circuits. The processes modeled in this first version of the simulator include ion implantation, diffusion, and activation, and the simulator includes a routine to calculate threshold voltage for a MESFET or JFET based on the simulated processing results and on substrate properties. Parameters for the models were derived from an extensive number of implantation and diffusion experiments, the major results of which are presented in this paper.
  • Keywords
    Circuit simulation; Computational modeling; Computer aided manufacturing; Computer integrated manufacturing; Computer simulation; Digital integrated circuits; Gallium arsenide; Integrated circuit manufacture; Manufacturing processes; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1987 International
  • Type

    conf

  • DOI
    10.1109/IEDM.1987.191403
  • Filename
    1487361