Title :
ESD robust integrated output device for smart power ICs
Author :
Pendharkar, Sameer ; Brodsky, Jonathan ; Hower, Phil ; Steinhoff, Robert
Keywords :
Electrostatic discharge; IEC standards; Instruments; Pins; Power electronics; Power integrated circuits; Power system protection; Robustness; Switches; Voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 2005. Proceedings. ISPSD '05. The 17th International Symposium on
Print_ISBN :
0-7803-8890-9
DOI :
10.1109/ISPSD.2005.1488022