Characterization of CSS deposited CdTe films by electron back-scatter diffraction technique

The properties of a material are affected by the orientations of individual grains, that is, by its microtexture. Microtexture can be determined in a scanning electron microscope by analyzing the electron back-scatter diffraction patterns provided by the specimen. This work focuses upon microtexture determination in cadmium telluride thin films deposited by close spaced sublimation. The texture of individual grains, the misorientation between grains, and coincident site lattice boundary maps were obtained, showing that electron back-scatter diffraction is a useful technique for investigating grain boundary features in these films.