Title :
Development of a new 550× concentrator module with 3J cells - performance and reliability
Author :
Araki, Kenji ; Uozumi, Hisafumi ; Kondo, Michio ; Takamoto, Tatsuya ; Agui, Takaaki ; Kaneiwa, Minoru ; Egami, Toshio ; Hiramatsu, Masao ; Miyazaki, Yoshinori ; Kemmoku, Yoshishige ; Akisawa, Atsushi ; Lee, H.S. ; Ekins-Daukes, N.J. ; Yamaguchi, Masafumi
Author_Institution :
Daido Steel Co., Nagoya, Japan
Abstract :
The status of the development of a new concentrator module in Japan is discussed based on three arguments, performance, reliability and cost. The peak uncorrected efficiency for a 7,056 cm2 400× module with 36 solar cells connected in series was 26.6 % was measured in house. The peak uncorrected efficiencies of the same type of the module with 6 solar cells connected in series and 1,176 cm2 area measured by Fraunhofer ISE and NREL were 27.4 % and 24.8 % respectively. The peak uncorrected efficiency for a 550× and 5,445 cm2 module with 20 solar cells connected in series was 28.9 %. The temperature corrected efficiency under the best sunshine condition in Japan for the 550× module was 31.5±2%. For reliability, some new degradation modes inherent to high concentration III-V solar cell system are discussed and a 20 year lifetime under concentrated flux exposure proven. The fail-safe issues of the concentrated sunlight are also discussed. For cost, the overall scenario for the reduction of material cost is discussed.
Keywords :
III-V semiconductors; cost reduction; life testing; semiconductor device reliability; semiconductor device testing; semiconductor heterojunctions; solar cells; 3J cells; 550× concentrator module development; concentrated flux exposure; concentrator module performance; concentrator module reliability; degradation modes; fail-safe issues; high concentration III-V solar cell system; material cost reduction; peak uncorrected efficiency; solar cells; temperature corrected efficiency; Costs; Educational institutions; Injection molding; Lenses; Optical design; Photovoltaic cells; Polymers; Steel; Testing; Thermal degradation;
Conference_Titel :
Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
Print_ISBN :
0-7803-8707-4
DOI :
10.1109/PVSC.2005.1488210