• DocumentCode
    3557652
  • Title

    Analysis of depletion-region collection in GaInNAs solar cells

  • Author

    Friedman, D.J. ; Ptak, A.J. ; Kurtz, Sarah R. ; Geisz, John F.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    691
  • Lastpage
    694
  • Abstract
    We provide qualitative insight into depletion-region collection in GaInNAs cells to (1) understand the effect of diffusion length L on the QE; and (2) describe the magnitude of L required to get adequate current from the cell. We use Wolf´s equations for the QE including a drift field E, and model E as being equal to the junction built-in voltage distributed uniformly across the depletion region. This allows us to calculate the QE as a function of L and depletion width WD. We show that if L is sufficiently small, increasing WD can actually decrease the QE. To determine how long L needs to be in a practical GaInNAs junction, we calculate from the QE the short-circuit current density as a function of WD and L. This allows us to estimate that Lambipolar needs to be greater than roughly 1 μm in order to obtain enough photocurrent for the 4-junction application, giving guidance to the experimental effort to develop such cells.
  • Keywords
    III-V semiconductors; current density; diffusion; gallium arsenide; gallium compounds; indium compounds; photoconductivity; semiconductor junctions; short-circuit currents; solar cells; 4-junction application; GaInNAs; GaInNAs junction; GaInNAs solar cells; Wolf equations; depletion-region collection analysis; diffusion length; drift field; junction built-in voltage; photocurrent; quantum efficiency; short-circuit current density; Current density; Epitaxial growth; Epitaxial layers; Equations; Laboratories; Photoconductivity; Photovoltaic cells; Renewable energy resources; Solid modeling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488225
  • Filename
    1488225