DocumentCode
3558196
Title
Simple model and study of charge handling and injection in charge-coupled devices
Author
Ferguson, R.S. ; Ryan, W.D.
Author_Institution
Queen´s University of Belfast, Department of Engineering Mathematics, Ashby Institute, Belfast, UK
Volume
128
Issue
6
fYear
1981
fDate
12/1/1981 12:00:00 AM
Firstpage
218
Lastpage
224
Abstract
An accurate simulation of charge transport in a charge-coupled device requires estimate to be made of fringing and self-induced fields. This has involved a two-dimensional solution for the potential distribution in the substrate, which can be expensive on computing time. The algorithm presented here restricts the calculation to a single set of nodal points along the surface of the device, and has been shown to be significantly faster, with little error, when compared with the corresponding two-dimensional solution. An attempt has also been made to obtain a simpler description of charge transport along the channel which avoids some of the problems which arise in the solution of the highly nonlinear transport equation. The simulation of two cases relevant to the operation of the CCD transfer process are presented. A study of injection from a source diffusion is also included.
Keywords
charge-coupled devices; semiconductor device models; CCD transfer process; algorithm; charge handling; charge injection; charge transport; charge-coupled devices; fringing field; model; nodal points; self-induced fields; semiconductor device model; simulation; source diffusion;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Proceedings I
Publisher
iet
Conference_Location
12/1/1981 12:00:00 AM
ISSN
0143-7100
Type
jour
DOI
10.1049/ip-i-1.1981.0053
Filename
4642593
Link To Document