• DocumentCode
    3558196
  • Title

    Simple model and study of charge handling and injection in charge-coupled devices

  • Author

    Ferguson, R.S. ; Ryan, W.D.

  • Author_Institution
    Queen´s University of Belfast, Department of Engineering Mathematics, Ashby Institute, Belfast, UK
  • Volume
    128
  • Issue
    6
  • fYear
    1981
  • fDate
    12/1/1981 12:00:00 AM
  • Firstpage
    218
  • Lastpage
    224
  • Abstract
    An accurate simulation of charge transport in a charge-coupled device requires estimate to be made of fringing and self-induced fields. This has involved a two-dimensional solution for the potential distribution in the substrate, which can be expensive on computing time. The algorithm presented here restricts the calculation to a single set of nodal points along the surface of the device, and has been shown to be significantly faster, with little error, when compared with the corresponding two-dimensional solution. An attempt has also been made to obtain a simpler description of charge transport along the channel which avoids some of the problems which arise in the solution of the highly nonlinear transport equation. The simulation of two cases relevant to the operation of the CCD transfer process are presented. A study of injection from a source diffusion is also included.
  • Keywords
    charge-coupled devices; semiconductor device models; CCD transfer process; algorithm; charge handling; charge injection; charge transport; charge-coupled devices; fringing field; model; nodal points; self-induced fields; semiconductor device model; simulation; source diffusion;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Proceedings I
  • Publisher
    iet
  • Conference_Location
    12/1/1981 12:00:00 AM
  • ISSN
    0143-7100
  • Type

    jour

  • DOI
    10.1049/ip-i-1.1981.0053
  • Filename
    4642593