DocumentCode
3559289
Title
Design and test for reliability and efficiency
Author
Cheng, Tim
Volume
25
Issue
6
fYear
2008
Firstpage
508
Lastpage
508
Keywords
Circuit testing; Design methodology; Field programmable gate arrays; Information security; Nanoscale devices; Network-on-a-chip; Semiconductor device reliability; Semiconductor device testing; Switches; System testing;
fLanguage
English
Journal_Title
Design Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2008.163
Filename
4702873
Link To Document