• DocumentCode
    3560048
  • Title

    The Role of Preoxidation on the Interface Structure of Co/MgO Multilayers

  • Author

    Eastwood, David S. ; Egelhoff, William F., Jr. ; Tanner, Brian K.

  • Author_Institution
    Dept. of Phys., Durham Univ., Durham
  • Volume
    44
  • Issue
    11
  • fYear
    2008
  • Firstpage
    3594
  • Lastpage
    3596
  • Abstract
    It has previously been reported that preoxidation of the bottom electrode prior to deposition of the Al 2 O 3 or MgO barrier in magnetic tunnel junctions acts to suppress orange-peel coupling between Co electrodes. Here, we present specular and diffuse X-ray scattering measurements from Co/MgO multilayer repeat structures which suggest that this drop arises from a reduction in the in-plane correlation length of the roughness at the electrode-barrier interface rather than reduction in roughness amplitude.
  • Keywords
    X-ray scattering; cobalt; interface roughness; magnesium compounds; magnetic multilayers; oxidation; Co-MgO; bottom electrode; diffuse X-ray scattering; interface structure; magnetic tunnel junctions; multilayer repeat structures; preoxidation; roughness in-plane correlation length; specular X-ray scattering; Grazing incidence X-ray scattering; multilayers; orange-peel coupling; preoxidation;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2008.2003243
  • Filename
    4717382
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3560048