Title :
SEU Analysis of Complex Circuits Implemented in Actel RTAX-S FPGA Devices
Author :
Berg, M. ; Kim, H. ; Friendlich, M. ; Perez, C. ; Seidleck, C. ; LaBel, K. ; Ladbury, R.
Author_Institution :
Goddard Space Flight Center, MEI Technol., Inc., NASA, Greenbelt, MD, USA
fDate :
6/1/2011 12:00:00 AM
Abstract :
A novel approach to SEE characterization of counters implemented in a RTAX-S FPGA is presented. Net fan-out, capacitive loading, and operational frequency have demonstrated a direct impact to counter SEU cross sections as compared to shift registers.
Keywords :
field programmable gate arrays; integrated circuit testing; logic circuits; shift registers; Actel RTAX-S FPGA devices; SEE characterization; SEU analysis; SEU cross sections; capacitive loading; complex circuits; net fan-out; shift registers; Clocks; Field programmable gate arrays; Radiation detectors; Shift registers; Single event upset; Testing; Counter test structures; error prediction; field programmable gate arrays; single event effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
Conference_Location :
4/21/2011 12:00:00 AM
DOI :
10.1109/TNS.2011.2128886
