DocumentCode
356142
Title
Source identification for voltage sag and flicker
Author
Hughes, Brian
Author_Institution
British Columbia Hydro, BC, Canada
Volume
2
fYear
2000
fDate
2000
Abstract
Summary form only given, as follows. Traditional sag and flicker measurements use voltage only. This is perfectly adequate to assess the utility system performance for survey or benchmarking purposes but has shortcomings when assessing sags and flicker causes by an individual customer. The new measurement technique described in this paper shows that by measuring current as well as voltage, and deriving the utility´s source impedance, the voltage sag and flicker measured at a customer´s point of supply can be separated into its two components-events caused by the customer being monitored and events already on the utility system. This separation is crucial in determining the voltage events that they are truly responsible for and not penalize them for sag and flicker coming from the utility or neighboring customers. This paper describes this new measurement technique and the subsequent Labview-based measurement system used to implement it. It also presents field studies that show how this measurement system was used to assess, in real time, the voltage flicker produced by two wood chip plants. In one case it provided a direct measure of the effectiveness of a DSTATCOM flicker countermeasure. In another case it provided conclusive evidence that a wood chip plant that wanted to expand was not the dominant source of voltage flicker in the area. These measurements gave the utility the confidence it need to allow the expansion knowing that the flicker increase would be small and acceptable
Keywords
harmonic distortion; power supply quality; power system faults; power system harmonics; power system identification; power system measurement; DSTATCOM flicker countermeasure; Labview; current measurements; field studies; flicker measurements; sag measurements; voltage events; voltage flicker source identification; voltage measurements; voltage sag source identification; Current measurement; Impedance measurement; Measurement techniques; Monitoring; Real time systems; Semiconductor device measurement; System performance; Voltage fluctuations; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Engineering Society Summer Meeting, 2000. IEEE
Conference_Location
Seattle, WA
Print_ISBN
0-7803-6420-1
Type
conf
DOI
10.1109/PESS.2000.867483
Filename
867483
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