• DocumentCode
    3564564
  • Title

    Integrated circuit (IC) aging effects on radio-frequency distinct native attributes (RF-DNA)

  • Author

    Deppensmith, Randall D. ; Stone, Samuel J.

  • Author_Institution
    Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • fYear
    2014
  • Firstpage
    331
  • Lastpage
    333
  • Abstract
    Device discrimination using RF-DNA utilizes the uniqueness resulting from integrated circuit (IC) manufacturing process variation. As an IC ages toward wear-out failure, internal physical alterations may impart additional changes on the order of initial process variations. This paper proposes exploration of: 1) the impact of aging on RF-DNA discrimination reliability, and 2) a means to monitor IC aging using RF-DNA.
  • Keywords
    ageing; failure analysis; fingerprint identification; integrated circuit manufacture; integrated circuit reliability; IC aging effect; RF-DNA; device discrimination; device specific fingerprint; integrated circuit manufacturing process variation; internal physical alteration; radiofrequency distinct native attribute; wear-out failure; Aging; Fingerprint recognition; Human computer interaction; Integrated circuit reliability; Integrated circuits; Sensors; RF-DNA; process variation; wear-out failure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, NAECON 2014 - IEEE National
  • Print_ISBN
    978-1-4799-4690-7
  • Type

    conf

  • DOI
    10.1109/NAECON.2014.7045830
  • Filename
    7045830
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3564564