• DocumentCode
    3565121
  • Title

    Sub-60 mV/decade steep transistors with compliant piezoelectric gate barriers

  • Author

    Jana, Raj K. ; Ajoy, Arvind ; Snider, Gregory ; Jena, Debdeep

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
  • fYear
    2014
  • Abstract
    A novel mechanism is proposed for transistors that exploits the negative differential capacitance of piezoelectric gate barriers. Electric field induced electrostriction modulates the thickness of a piezoelectric barrier. Piezoelectricity and electrostriction in a compliant piezoelectric barrier combine to provide negative differential capacitance (NDC) with internal charge amplification. The effect of the NDC in the gate capacitor of a FET is to boost the on-current, and to provide an opportunity for switching steeper than the 60 mV/decade Boltzmann limit, both highly desirable.
  • Keywords
    electrostriction; field effect transistors; piezoelectric devices; Boltzmann limit; FET; electric field induced electrostriction modulation; internal charge amplification; negative differential capacitance; piezoelectric barrier; piezoelectric gate barriers; steep transistor; Capacitance; Capacitors; Logic gates; Materials; Strain; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2014 IEEE International
  • Type

    conf

  • DOI
    10.1109/IEDM.2014.7047047
  • Filename
    7047047