DocumentCode
3565121
Title
Sub-60 mV/decade steep transistors with compliant piezoelectric gate barriers
Author
Jana, Raj K. ; Ajoy, Arvind ; Snider, Gregory ; Jena, Debdeep
Author_Institution
Dept. of Electr. Eng., Univ. of Notre Dame, Notre Dame, IN, USA
fYear
2014
Abstract
A novel mechanism is proposed for transistors that exploits the negative differential capacitance of piezoelectric gate barriers. Electric field induced electrostriction modulates the thickness of a piezoelectric barrier. Piezoelectricity and electrostriction in a compliant piezoelectric barrier combine to provide negative differential capacitance (NDC) with internal charge amplification. The effect of the NDC in the gate capacitor of a FET is to boost the on-current, and to provide an opportunity for switching steeper than the 60 mV/decade Boltzmann limit, both highly desirable.
Keywords
electrostriction; field effect transistors; piezoelectric devices; Boltzmann limit; FET; electric field induced electrostriction modulation; internal charge amplification; negative differential capacitance; piezoelectric barrier; piezoelectric gate barriers; steep transistor; Capacitance; Capacitors; Logic gates; Materials; Strain; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting (IEDM), 2014 IEEE International
Type
conf
DOI
10.1109/IEDM.2014.7047047
Filename
7047047
Link To Document