• DocumentCode
    3565276
  • Title

    High performance, excellent reliability multifunctional graphene oxide doped memristor achieved by self-protect ive compliance current structure

  • Author

    Kuan-Chang Chang ; Rui Zhang ; Ting-Chang Chang ; Tsung-Ming Tsai ; Tian-Jian Chu ; Hsin-Lu Chen ; Chih-Cheng Shih ; Chih-Hung Pan ; Yu-Ting Su ; Pei-Jung Wu ; Sze, Simon M.

  • Author_Institution
    Dept. of Mater. & Optoelectron. Sci., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2014
  • Abstract
    Double-ended graphene oxide (GO) doped silicon oxide based (SOB) via-structure RRAM with self-protective ability is reported in this paper. The fabricated RRAM exhibits comprehensive outstanding performance including switching speed (~30ns), endurance property (>1012 cycles), read disturbance immunity (>1010 cycles) and retention (>104s at 125°C, >144 days at room temperature). Combined with the applicability of complementary resistive switching structure and whole-cycle multi-bit operation, it is quite promising for this RRAM to be applied in future mass productions.
  • Keywords
    graphene; graphene devices; memristors; resistive RAM; silicon compounds; vias; GO doped silicon oxide; SOB via-structure RRAM; SiO2:CO; complementary resistive switching structure; double-ended graphene oxide; endurance property; read disturbance immunity; reliable multifunctional graphene oxide doped memristor; retention; self-protective compliance current structure; switching speed; temperature 125 C; whole-cycle multibit operation; Chemicals; Educational institutions; Graphene; Performance evaluation; Reliability; Sun; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting (IEDM), 2014 IEEE International
  • Type

    conf

  • DOI
    10.1109/IEDM.2014.7047161
  • Filename
    7047161