Title :
Past Mixed-mode Simulation For Accurate MOS Bridging Fault Detection
Author :
Weitong Chuang ; Haj, I.N.
Author_Institution :
University of Illinois
Keywords :
Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Digital circuits; Electrical fault detection; Fault detection; Logic testing; Switching circuits; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
