• DocumentCode
    3568359
  • Title

    On Multiple Fault Detection Of Parity Checkers

  • Author

    Wen-Ben Jone

  • fYear
    1993
  • Firstpage
    1515
  • Lastpage
    1518
  • Keywords
    Circuit faults; Circuit testing; Computer errors; Computer science; Digital systems; Electrical fault detection; Fault detection; Feedback; Reliability engineering; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
  • Print_ISBN
    0-7803-1281-3
  • Type

    conf

  • Filename
    692946