DocumentCode
3568930
Title
Investigation of the electrical and chemical processes causing the failure event in a copper sulfide related transformer failure
Author
Amaro, P.S. ; Facciotti, M. ; Lewin, P.L. ; Pilgrim, J.A. ; Brown, R.C.D. ; Wilson, G. ; Jarman, P.N.
Author_Institution
EdifERA, London, UK
fYear
2015
Firstpage
392
Lastpage
396
Abstract
Copper sulfide related failures of oil-filled plants have become more common around most parts of the world over the last couple of decades, which has led the industry to re-evaluate their asset risk analysis policy for mineral oil insulated power assets. Two main theories for the failure event suggested by the current state-of-the-art are thermal runaway and turn-to-turn disk electrical breakdown. This paper provides an over view of two possible failure scenarios, electrical breakdown and low degree of polymerization, and the likelihood of corrosive oil causing each scenario. Empirical DP studies have demonstrated that the corrosion process degrades the chemical cellulose chain bonds, where DP-life expectancy models demonstrated that the corrosion process reduces 33 % of the transformer life expectancy. The electrical breakdown strength experiments demonstrated that the CuxS deposits reduced the electrical breakdown strength of each Kraft paper layer. Finally the results are considered in the larger context of the transformer insulation life-expectancy and its probability of causing the failure event.
Keywords
corrosion; electric breakdown; failure analysis; power transformer insulation; transformer oil; asset risk analysis policy; chemical process; copper sulfide related transformer failure; corrosive oil; electrical process; failure event; mineral oil insulated power assets; oil filled plants; thermal runaway; transformer life expectancy; turn-to-turn disk electrical breakdown; Conferences; Insulation; Breakdown Strength; Copper Sulfide; DP; Transformer; Transformer Failures;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation Conference (EIC), 2015 IEEE
Print_ISBN
978-1-4799-7352-1
Type
conf
DOI
10.1109/ICACACT.2014.7223493
Filename
7223493
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