DocumentCode :
3569468
Title :
An 8-bit Analog-to-Digital Converter based on the voltage-dependent switching probability of a Magnetic Tunnel Junction
Author :
Won Ho Choi ; Yang Lv ; Hoonki Kim ; Jian-Ping Wang ; Kim, Chris H.
Author_Institution :
Dept. of ECE, Univ. of Minnesota, Minneapolis, MN, USA
fYear :
2015
Abstract :
In this work, we have experimentally demonstrated for the first time, an Analog-to-Digital Converter (ADC) based on the unique voltage-dependent switching probability of a Magnetic Tunnel Junction (MTJ). The switching probability was calculated by applying repetitive voltage pulses and measuring the resolved MTJ states in each sampling time window. Temperature sensitivity and MgO breakdown issues were minimized by optimizing the voltage pulse width. Circuit level techniques were utilized to improve the ADC linearity and increase the input voltage range. The proposed ADC achieves an 8-bit resolution with excellent linearity at 30 and 85°C.
Keywords :
analogue-digital conversion; magnetic tunnelling; probability; analog-to-digital converter; magnetic tunnel junction; repetitive voltage pulses; sampling time window; temperature 85 degC; temperature sensitivity; voltage-dependent switching probability; Calibration; Linearity; Magnetic tunneling; Semiconductor device measurement; Switches; Temperature measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology (VLSI Technology), 2015 Symposium on
ISSN :
0743-1562
Type :
conf
DOI :
10.1109/VLSIT.2015.7223662
Filename :
7223662
Link To Document :
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