DocumentCode :
3570410
Title :
A systematic approach of statistical modeling and its application to CMOS circuits
Author :
Styblinski, M.A.
fYear :
1993
Firstpage :
1805
Lastpage :
1808
Keywords :
Circuit simulation; Circuit synthesis; Fabrics; Integrated circuit modeling; Minimization methods; Principal component analysis; Production; Scattering parameters; Semiconductor device modeling; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
693021
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3570410