DocumentCode
357168
Title
Advanced technologies and their impact on EMC standardization and EMC measurement techniques
Author
GöPEL, KLAUS D.
Author_Institution
Rohde & Schwarz, Munchen, Germany
fYear
1999
fDate
6-8 Dec. 1999
Firstpage
241
Lastpage
243
Abstract
New technologies in combination with the demand from the market will affect future work in EMC standardization, test concepts as well as the development of new EMC test instrumentation and systems. Trends can already be recognized. The paper describes the market demands, technology trends in different product areas and current changes in EMC standardization. Some of the requirements for new EMC measurement techniques are derived from this consideration.
Keywords
electromagnetic compatibility; standardisation; EMC measurement; EMC standardization; test instrumentation; Aerospace electronics; Consumer electronics; Consumer products; Electromagnetic compatibility; Immune system; Immunity testing; Measurement techniques; Standardization; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN
81-900652-0-3
Type
conf
DOI
10.1109/ICEMIC.1999.871636
Filename
871636
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