Title :
A 3-Transistor DRAM Line Memory for the Video Processor
Author :
Hatanaka, N. ; Takada, T. ; Ohto, T. ; Kitagaki, K. ; Niwa, K.
Author_Institution :
TOSHIBA Corporation, Kawasaki, Japan
Keywords :
Circuit testing; Fabrication; HDTV; High definition video; Large scale integration; Random access memory; Read-write memory; Shift registers; Signal processing; TV;
Conference_Titel :
Solid-state Circuits Conference, 1987. ESSCIRC '87. 13th European
