DocumentCode
357208
Title
Transient response of electronic devices and their failure mechanism
Author
Tyagi, Satish K.
Author_Institution
DEAL, Dehradun, India
fYear
1999
fDate
6-8 Dec. 1999
Firstpage
497
Lastpage
499
Abstract
The paper presents the failure mechanism of some of the commonly used components in electronic systems when transients appear upon them. It is estimated theoretically that low power transistors and microwave mixer diode are most susceptible to incoming transients with energy of the order of 1 μJ or even less.
Keywords
electromagnetic pulse; failure analysis; microwave diodes; microwave mixers; power transistors; transient response; EMP; electronic devices; electronic systems; failure mechanism; incoming transients; low power transistors; microwave mixer diode; transient response; Circuits; EMP radiation effects; Electromagnetic transients; Estimation theory; Failure analysis; Laboratories; Microwave devices; Power transistors; Resistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN
81-900652-0-3
Type
conf
DOI
10.1109/ICEMIC.1999.871691
Filename
871691
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