• DocumentCode
    3572265
  • Title

    SiCGe Ternarv Allovs - Extending Si-based Heterostructures

  • Author

    Iyer, S.S. ; Eberl, K. ; Powell, A.R. ; Ek, B.A.

  • Author_Institution
    IBM Research Division, T.J. Watson Research Center Yorktown Heights, New York 10598
  • fYear
    1992
  • Firstpage
    351
  • Lastpage
    354
  • Abstract
    We have synthesized Si1-y Cyand Si1-x-yCyGexalloys using Molecular Beam Epitaxy. When combined with the Si-Ge system. the new ternary system offers greater versatility and freedom in strain and bandgap engineering. Unlike the Si-Ge system the Si-C system has a high misfit (52%) and low solubility (≪ 10-6), with a propensity to compound formation, therefore. the structures are kinetically stabilized by low temperature growth. In this paper. we first describe bandgap engineering applied to this system. We then consider the growth methodology and critical thickness. Strain compensation and strain engineering using the ternary system is then described. Finally we show that thermal degradation of these films does not occur till ≫ 800°C first by interdiffusion and subsequently at higher temperatures by silicon carbide precipitation.
  • Keywords
    Capacitive sensors; Epitaxial growth; Germanium alloys; Germanium silicon alloys; Lattices; Molecular beam epitaxial growth; Photonic band gap; Silicon alloys; Silicon carbide; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Print_ISBN
    444894780
  • Type

    conf

  • Filename
    5435116