• DocumentCode
    3574992
  • Title

    Low-noise CMOS amplifier for readout electronic of resistive NEMS audio sensor

  • Author

    Nebhen, J. ; Savary, E. ; Rahajandraibe, W. ; Dufaza, C. ; Meillere, S. ; Kussener, E. ; Barthelemy, H. ; Czarny, J. ; Lhermet, H.

  • Author_Institution
    IM2NP, Aix Marseille Univ., Marseille, France
  • fYear
    2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Investigation of readout electronic dedicated to electromechanical audio sensor is presented. The circuit is able of reading piezoresistive gauge implemented with silicon nanowire (NEMS) and bring electromechanical signal to high-resolution digital output. Low-noise low-power CMOS operational transconductance amplifier (OTA) is presented. The low-noise amplifier (LNA) has been designed in a 0.28 μm CMOS process with a 2.5 V supply voltage and occupies an area of 120 × 160 μm2. For the Post-layout Simulation, the OTA achieves a 65 dB DC gain. It achieves a noise floor of 6 nV/√Hz within the frequency range from 1 Hz to 10 kHz. The total power consumption including the common mode feedback circuit (CMFB) and the biasing circuit is 150 μW.
  • Keywords
    CMOS integrated circuits; audio-frequency amplifiers; low noise amplifiers; nanosensors; nanowires; operational amplifiers; piezoresistive devices; power consumption; readout electronics; silicon; CMFB; DC gain; LNA; OTA; Si; biasing circuit; common mode feedback circuit; electromechanical audio sensor; electromechanical signal; frequency 1 Hz to 10 kHz; gain 65 dB; high-resolution digital output; low noise CMOS amplifier; low-power CMOS operational transconductance amplifier; nanowire; noise floor; piezoresistive gauge; post-layout simulation; power 150 muW; power consumption; readout electronic; resistive NEMS audio sensor; size 0.28 mum; supply voltage; voltage 2.5 V; CMOS integrated circuits; Gain; Microphones; Modulation; Noise; Power demand; Silicon; Audio sensor; LNA; Low-noise; MEMS microphone; OTA;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014 Symposium on
  • Print_ISBN
    978-2-35500-028-7
  • Type

    conf

  • DOI
    10.1109/DTIP.2014.7056676
  • Filename
    7056676