DocumentCode :
3575633
Title :
Quality factor and resonant frequency measurement by ARMA process identification of randomly excited MEMS/NEMS cantilever
Author :
Jozwiak, Grzegorz ; Kopiec, Daniel ; Majstrzyk, Wojciech ; Gotszalk, Teodor ; Grabiec, Piotr
Author_Institution :
Fac. of Microsyst. Electron. & Photonics, Wroclaw Univ. of Technol., Wroclaw, Poland
fYear :
2014
Firstpage :
151
Lastpage :
154
Abstract :
Microcantilever based sensors are very promising devices for biochemical applications. They usually operate in two modes. In the first one a microcantilever static bending induced by the surface stress is observed, while in the second mode, resonant frequency shift caused by mass loading is measured. In the paper, the real-time noise analysis (RTNA) technique is presented. It is based on ARMA process modeling. The estimated model parameters are used for the calculation of the eigenfrequency and quality factor of a given vibration mode. The description of the entire procedure is presented as well as the results of an analysis of stochastic response of an electromagnetically excited cantilever. These results confirm validity of the proposed ARMA model and show the expected estimation errors. The proposed solution is an interesting option, especially, if the simplicity and the cost of the measurement system are important issues.
Keywords :
Q-factor; autoregressive moving average processes; frequency measurement; micromechanical devices; microsensors; nanoelectromechanical devices; real-time systems; vibrational modes; ARMA process identification; autoregressive moving average model; eigenfrequency calculation; electromagnetically excited cantilever; microcantilever based sensors; quality factor; randomly excited MEMS cantilever; randomly excited NEMS cantilever; real-time noise analysis; resonant frequency measurement; stochastic response; vibration mode; Band-pass filters; Correlation; Equations; Mathematical model; Noise; Q-factor; Resonant frequency; ARMA process; MEMS; NEMS; stochastic response;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014 International Conference on
Type :
conf
DOI :
10.1109/3M-NANO.2014.7057324
Filename :
7057324
Link To Document :
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