Title :
Measurement of dispersion in a silicon waveguide at 1.5 /spl mu/m
Author :
Liang, T.K. ; Tsang, H.K. ; Roberts, S.W. ; Brady, D.J. ; Harpin, A. ; Drake, J. ; Asghari, M.
Author_Institution :
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Shatin, China
Abstract :
We report for the first time measurements of the dispersion coefficient in a silicon waveguide at 1.5 /spl mu/m wavelength. The total dispersion was found to be only -9.1 fs/[nm.cm].
Keywords :
Mach-Zehnder interferometers; integrated optics; optical communication equipment; optical dispersion; optical testing; optical waveguides; silicon; wavelength division multiplexing; 1.5 micron; DWDM components; Si; dispersion coefficient; dispersion coefficients; free-space Mach-Zehnder interferometer; silicon rib waveguides; silicon waveguide dispersion measurement; total dispersion; Delay effects; Dispersion; Optical interferometry; Optical refraction; Optical variables control; Optical waveguides; Semiconductor optical amplifiers; Semiconductor waveguides; Silicon; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.971163
