DocumentCode
357870
Title
Estimation of countermeasure effect by a bypass condenser at a source terminal of a CMOS IC
Author
Kazama, Satoshi ; Shinohara, Shinichi ; Sato, Risaburo ; Shimizu, Masayuki
Author_Institution
Electromagnetic Compatibility Res. Labs. Co. Ltd., Sendai, Japan
Volume
1
fYear
2000
fDate
2000
Firstpage
353
Abstract
A method for measuring source pin current and an equivalent circuit for the source pin of a CMOS digital integrated circuit are proposed. This equivalent circuit includes the capacitance of the integrated circuit protection diode and the inductance of the lead frame. Using this equivalent circuit, the changes in terminal current that occur when countermeasure components such as a bypass capacitor are inserted can be estimated. The proposed current measurement method was used to verify this equivalent circuit. In addition, the relation between the source pin current and the radiated electromagnetic field was clarified. These results show that this equivalent circuit can be used to estimate the effect of inserting source pin countermeasure components on electromagnetic interference
Keywords
CMOS digital integrated circuits; capacitance; capacitors; electric current measurement; electromagnetic fields; electromagnetic interference; equivalent circuits; inductance; interference suppression; semiconductor diodes; CMOS digital IC; CMOS digital integrated circuit; bypass capacitor; bypass condenser; capacitance; countermeasure effect estimation; current measurement method; electromagnetic interference; equivalent circuit; integrated circuit protection diode; lead frame inductance; radiated electromagnetic field; source pin countermeasure components; source pin current measurement; source terminal; terminal current; CMOS digital integrated circuits; Capacitance; Capacitors; Current measurement; Diodes; Electromagnetic fields; Equivalent circuits; Inductance; Integrated circuit measurements; Protection;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location
Washington, DC
Print_ISBN
0-7803-5677-2
Type
conf
DOI
10.1109/ISEMC.2000.875592
Filename
875592
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