DocumentCode
3579061
Title
Leaf recognition using contour based edge detection and SIFT algorithm
Author
Lavania, Shubham ; Matey, Palash Sushil
Author_Institution
School of Electronic Engineering, VIT University, Vellore, India
fYear
2014
Firstpage
1
Lastpage
4
Abstract
The paper presents two advanced methods for comparative study in the field of computer vision. The first method involves the implementation of the Scalar Invariant Fourier Transform (SIFT) algorithm for the leaf recognition based on the key descriptors value. The second method involves the contour-based corner detection and classification which is done with the help of Mean Projection algorithm. The advantage of this system over the other Curvature Scale Space (CSS) systems is that there are fewer false-positive (FP) and false-negative (FN) points compared with recent standard corner detection techniques. The performance analysis of both the algorithm was done on the flavia database.
Keywords
Accuracy; Classification algorithms; Computer vision; Databases; Detectors; Feature extraction; Image edge detection; SIFT; contour-based corner detector; corner detection; leaf recognition; mean projection transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence and Computing Research (ICCIC), 2014 IEEE International Conference on
Print_ISBN
978-1-4799-3974-9
Type
conf
DOI
10.1109/ICCIC.2014.7238345
Filename
7238345
Link To Document