DocumentCode :
3579681
Title :
LIN validation frame-work: a novel approach
Author :
Sinha, Amit ; Anand, Chetan ; Gupt, Saurabh
Author_Institution :
Freescale Semicond., Noida, India
fYear :
2014
Firstpage :
163
Lastpage :
167
Abstract :
Automotive semiconductor industry is passing through an era where it is pushing the complex mechanical interconnects to be replaced by the mechatronical system. To simplify the wiring design and to handle the communication process effectively between various systems in automobiles, LIN (Local Interconnect Network) bus protocol has been designed. It is widely used in numerous applications like door locks, mirrors, rain sensors, powertrain, central ECU, etc even at very high temperature.
Keywords :
automotive electrics; mechatronics; LIN validation frame-work; automotive semiconductor industry; local interconnect network bus protocol; mechatronical system; Clocks; Protocols; Silicon; Stress; Synchronization; System-on-chip; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vehicular Electronics and Safety (ICVES), 2014 IEEE International Conference on
Type :
conf
DOI :
10.1109/ICVES.2014.7063741
Filename :
7063741
Link To Document :
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