Title :
Optimization of test signals for analog circuits
Author :
Guliashki, V. ; Burdiek, B. ; Mathis, W.
Author_Institution :
Inst. of Inf. Technol., Bulgarian Acad. of Sci., Sofia, Bulgaria
Abstract :
In this paper the optimization of test signals for integrated analog circuits by means of a genetic algorithm is considered. The test signal generation problem is formulated as an optimization problem, where through minimization of specific objective function a fault detection criterion for the tested circuit is maximized. The simulation results show that the use of optimized test signals leads to considerable increasing of the detected faults number.
Keywords :
analogue integrated circuits; optimisation; testing; fault detection criterion; genetic algorithm; integrated analog circuit; objective function; optimization; signal generation; signal test; tested circuit; Analog circuits; Artificial intelligence; Circuit faults; Circuit simulation; Circuit testing; Concrete; Electrical fault detection; Fault detection; Genetic algorithms; Space vector pulse width modulation;
Conference_Titel :
Telecommunications in Modern Satellite, Cable and Broadcasting Service, 2003. TELSIKS 2003. 6th International Conference on
Print_ISBN :
0-7803-7963-2
DOI :
10.1109/TELSKS.2003.1246200
