• DocumentCode
    358579
  • Title

    Precision terrain mapping using large baseline interferometry

  • Author

    Carender, Neil ; Dwyer, J. Craig ; Abshier, James ; Cowen, Eric ; Howlett, Brent

  • Author_Institution
    Veridian ERIM Int. Inc., Ann Arbor, MI, USA
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    27
  • Abstract
    Veridian ERIM International, with support from the US Air Force and the Defense Advanced Research Projects Agency Tactical Technology Office (DARPA/TTO), has developed an airborne X-band SAR system capable of collecting single-pass interferometric SAR data with cross-track baselines of 7.5 m, 15 m, and 30 m. SAR data have been collected over several sites with varying terrain and groundcover type. These data have been formed into 1-foot resolution imagery and interferometric processing has produced digital elevation data with post spacings of 1 m. The resulting elevation data have been compared with LIDAR elevation data in order to estimate the accuracy of the SAR elevation measurements. SAR elevation data with accuracy approaching the draft Level 5 specification for precision elevation data have been produced
  • Keywords
    airborne radar; microwave imaging; radiowave interferometry; synthetic aperture radar; terrain mapping; 1 feet; 1-foot resolution imagery; 15 m; 30 m; 7.5 m; Defense Advanced Research Projects; LIDAR elevation data; SAR elevation measurements; US Air Force; Veridian ERIM International; airborne X-band SAR system; cross-track baselines; digital elevation data; interferometric processing; large baseline interferometry; post spacings; precision elevation data; precision terrain mapping; single-pass interferometric SAR data; Data processing; Decorrelation; Distributed control; Laser radar; Measurement errors; Phase noise; Receiving antennas; Sensor phenomena and characterization; Synthetic aperture radar interferometry; Terrain mapping;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference Proceedings, 2000 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-5846-5
  • Type

    conf

  • DOI
    10.1109/AERO.2000.878469
  • Filename
    878469