Title :
A comparative analysis of jitter estimation techniques
Author :
Sharma, Vijender Kumar ; Tripathi, Jai Narayan ; Nagpal, Rajkumar ; Deb, Sujay ; Malik, Rakesh
Author_Institution :
Dept. of Electron. & Commun. Eng., IIIT Delhi, New Delhi, India
Abstract :
With the advancement of VLSI technology, the effect of jitter is becoming more critical on high speed signals. To negate the effect of jitter on these signals, the causes of jitter in a circuit need to be identified by decomposing the jitter. In this paper, a comparative analysis of various jitter estimation techniques is presented. The statistical domain methods are based on fitting techniques while the frequency domain methods are based on frequency spectrum analysis. This work describes both statistical domain methods and frequency domain methods. Further, their strengths and limitations are discussed. The algorithms are implemented in MATLAB and the results are extensively verified with Agilent ADS.
Keywords :
VLSI; frequency-domain analysis; jitter; spectral analysis; statistical analysis; Agilent ADS; MATLAB; VLSI technology; fitting techniques; frequency domain methods; frequency spectrum analysis; high speed signals; jitter estimation techniques; statistical domain methods; Algorithm design and analysis; Estimation; Fitting; Frequency-domain analysis; Histograms; Interpolation; Jitter; Convolution; Decomposition; FFT; High Speed Systems; Jitter; Jitter Generator; Tail-fit Algorithm;
Conference_Titel :
Electronics,Communication and Computational Engineering (ICECCE), 2014 International Conference on
DOI :
10.1109/ICECCE.2014.7086645