• DocumentCode
    358608
  • Title

    Reliability of commercial plastic encapsulated microelectronics at temperatures from 125°C to 300°C

  • Author

    McCluskey, Patrick ; Mensah, Kofi ; O´Connor, C. ; Lilie, Fabian ; Gallo, Anthony ; Fink, John

  • Author_Institution
    CALCE Electron. Products & Syst. Center, Maryland Univ., College Park, MD, USA
  • Volume
    5
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    445
  • Abstract
    Over 97% of all integrated circuits produced today are available only in plastic encapsulated, surface mountable, commercial grade or industrial grade versions. This is especially true for the most advanced technologies, such as high-speed microprocessors. The cost, availability, and functionality advantages of these devices are causing many electronics manufacturers to consider using them in elevated temperature applications such as avionics and automotive electronic systems to ensure early affordable access to leading edge technology. However, manufacturers only guarantee the operation of commercial devices in the 0 to 70°C temperature range, and the industrial devices in the -40 to 85°C temperature range. This paper describes the first study which addresses the reliability of plastic encapsulated microcircuits (PEMs) in the range from 125 to 300°C, well outside the manufacturer´s suggested temperature limits. In this study, Motorola MC68332 microcontroller, which is widely used in avionic systems, remained fully functional to 180°C. However, this study also revealed that industrial grade, plastic encapsulated MC68332 devices had less than half the lifespan at 180°C of similar MC68332 devices packaged in hermetic ceramic packages. In addition to the MC68332, the other nine types of plastic components studied had a shorter lifespan at 180°C than their ceramic packaged counterparts. Outgassing of flame retardants with the associated catalysis of the growth of intermetallics was determined to be the principal cause of failure in the plastic components. Further studies conducted on 84-lead PQFP leadframes encapsulated in two different molding compounds revealed that the plastic encapsulant itself begins to lose its ability to insulate leads at temperatures greater than 250°C and can actually combust at temperatures greater than 300°C. Both insulation resistance degradation and cracking were found to be more prevalent in novalac than biphenyl
  • Keywords
    automotive electronics; avionics; encapsulation; integrated circuit packaging; integrated circuit reliability; microcontrollers; outgassing; plastic packaging; thermal management (packaging); 125 to 300 C; Motorola MC68332 microcontroller; automotive electronics; avionic systems; commercial plastic encapsulated microcircuits; elevated temperature applications; epoxy degradation; insulation resistance degradation; molding compounds; outgassing of flame retardants; plastic QFP leadframes; relative reliability; Aerospace electronics; Ceramics; Integrated circuit reliability; Integrated circuit technology; Manufacturing industries; Microelectronics; Microprocessors; Plastic packaging; Plastics industry; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference Proceedings, 2000 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-5846-5
  • Type

    conf

  • DOI
    10.1109/AERO.2000.878520
  • Filename
    878520