Scan cell reordering algorithm for low power consumption during scan-based testing

Power consumption during scan-based testing can be higher than that of normal mode operations, which can cause yield loss and degradation of reliability. This paper proposes a scan cell reordering algorithm to reduce the test power consumption during scan-based testing. The proposed algorithm considers both shift-out operations and shift-in operations. A cumulative weighted transition (CWT) is proposed and compared to minimize the test power consumption. Experimental results show that the proposed method greatly reduces the average power during scan testing.