Title :
IO power delivery network impedance measurement at chip level
Author :
Fei Guo ; Catherine, Solis
Author_Institution :
Adv. Micro Devices, Markham, ON, Canada
Abstract :
This paper describes a technique for characterizing Input/Output (IO) power delivery networks using Vector Network Analyzer (VNA) S21 measurements, which is expanded from the core Power Delivery Networks (PDN) measurement technique we developed. The technique uses the two-port, self-impedance measurement concept for low impedance PDN measurement. It is validated mathematically through network analysis and makes use of an auxiliary test fixture to remove the effect of the channel between measurement points and bumps. Measurements of a sample are presented to show the effectiveness of the methodology.
Keywords :
electric impedance measurement; microprocessor chips; network analysers; network analysis; IO power delivery network; VNA measurements; auxiliary test fixture; chip level; input-output power delivery networks; network analysis; self-impedance measurement; vector network analyzer; Current measurement; Impedance; Impedance measurement; Ports (Computers); Semiconductor device measurement; Switches; System-on-chip; Vector Network Analyzer; power delivery network impedance measurement;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103608