Title :
Analysis of novel technology for power and signal integrity using a metal particle conductive layer
Author :
Sasaoka, Norifumi ; Oono, Masato ; Ueda, Chihiro ; Otsuka, Kanji
Author_Institution :
Nippon Kodoshi Corp., Kochi, Japan
Abstract :
Power integrity (PI) has been an important technological issue in the field of electronic circuits and systems. It has been addressed in important papers using several different approaches [1][2]. The latest concept of the best PI condition is a low impedance between the power and ground lines or planes, that can be maintained regardless of the clock frequency, even in the GHz region. A novel technology was used in our previous study, in which a metal particle conductive layer (MPCL) was used instead of a copper plane [3][4]. This structure improved the PI for any clock frequency, particularly in the GHz region. The MPCLs consist of micrometer sized silver flakes (SF) and binder resin. In this study, we used an epoxy as a binder for conductive paste and polyimide (PI) copper clad laminate (CCL) as the inner dielectric of test coupons. These are general-use material so that they can be made easily, and apply to printed circuit boards (PCBs) and package substrates (PKGs). It has been found from transmission line test coupon measurements, that energy propagation time and frequency characteristics, are strongly affected by the metal particle content and chemical composition. From power/GND plane test coupon measurements, MPCL can reduce Z11 about 70% compared with copper plane from 1 to 5GHz frequency region. In this paper, we reveal the detail phenomena of MPCL exceed the region of usual transmission line theory and some critical factors to improve PI using MPCL.
Keywords :
conducting materials; dielectric materials; laminates; printed circuits; resins; CCL; GHz region; MPCL; PCB; PKG; binder resin; chemical composition; clock frequency; conductive paste; copper plane; electronic circuit; energy propagation time; epoxy; frequency 1 GHz to 5 GHz; inner dielectric; metal particle conductive layer; package substrate; polyimide copper clad laminate; power integrity; printed circuit board; signal integrity; silver flake; transmission line test coupon measurement; Conductivity; Copper; Dielectrics; Polyimides; Power transmission lines; Transmission line measurements; impedance; power integrity; signal integrity;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN :
978-1-4799-3641-0
DOI :
10.1109/EPEPS.2014.7103633