DocumentCode
3589018
Title
Accuracy tolerance analysis of the multimode TRL de-embedding technique
Author
Gen Yin ; Xiao-Ding Cai ; Secker, David ; Ortiz, Matt ; Cline, Julia ; Vaidyanath, Arun
Author_Institution
Dept. of Electr. Eng., Univ. of California, Riverside, Riverside, CA, USA
fYear
2014
Firstpage
203
Lastpage
206
Abstract
A perturbation analysis is carried out in the multimode TRL (through-reflection-line) de-embedding formulae to evaluate the accuracy tolerance. The trends obtained by this analysis is confirmed by the corresponding experimental verifications.
Keywords
network analysers; network analysis; perturbation techniques; tolerance analysis; accuracy tolerance analysis; multimode TRL deembedding formulae; multimode TRL deembedding technique; perturbation analysis; through-reflection-line; Calibration; Impedance; Power transmission lines; Scattering parameters; Standards; Transmission line matrix methods; Transmission line measurements; Multimode TRL; accuracy tolerance; de-embedding;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Performance of Electronic Packaging and Systems (EPEPS), 2014 IEEE 23rd Conference on
Print_ISBN
978-1-4799-3641-0
Type
conf
DOI
10.1109/EPEPS.2014.7103634
Filename
7103634
Link To Document