• DocumentCode
    3589787
  • Title

    The storage failure mode and failure mechanism study of high-power klystron

  • Author

    Fangfang Song ; Ruguang Li ; Liyuan Liu ; Yunfei En ; Bin Li

  • Author_Institution
    Sch. of Electron & Inf., South China Univ. of Technol., Guangzhou, China
  • fYear
    2014
  • Firstpage
    279
  • Lastpage
    282
  • Abstract
    Firstly, the storage failure mode and failure mechanism study of the klystron was carried out, the main failure modes of klystron in storage were summarized, and the failure mechanism and failure reasons of the main failure mode were analyzed. The results of the study showed that the vacuum degree decline is the main reason for the failure in long-term storage of klystron. The vacuum degree decline of tube is due to the residual gas of in seal manufacturing process or the deflation and shell leakage of the tube during the period of storage. Secondly, the generation process of residual gas was studied. At last, a failure sample of long-term storage klystron was analyzed; results showed that the failure mechanism was due to a large number of evaporation the cathode emission material which induced the serious degeneration of cathode, then the cathode emission current reduced and the out power declined. The reason of cathode degradation was vacuum degree decline in long-term storage process, ions back to the cathode surface that caused the huge evaporation of cathode emitting material.
  • Keywords
    failure analysis; klystrons; cathode degradation; cathode emission material; cathode surface; deflation; failure mechanism study; failure reasons; generation process; high-power klystron; residual gas; seal manufacturing process; shell leakage; storage failure mode; vacuum degree decline; Barium; Cathodes; Failure analysis; Klystrons; Surface morphology; Surface treatment; failure mode and failure mechanism; klystron; residual gas; storage failure; vacuum degree;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
  • Print_ISBN
    978-1-4799-6631-8
  • Type

    conf

  • DOI
    10.1109/ICRMS.2014.7107187
  • Filename
    7107187