DocumentCode
3589852
Title
Thermal coupling effects and thermal resistance matrix research of multi-heat sources MCM
Author
Ji Cheng ; Xiaoqi He ; Xunping Li ; Bin Zhou ; Hengwei Bao ; Lianrong Zhou ; Zhangchao Wang
Author_Institution
Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Guangzhou, China
fYear
2014
Firstpage
715
Lastpage
719
Abstract
High density assembly results in evident thermal coupling effect among chips in MCM. Junction temperature is decided by self-heating effect and thermal coupling effect. It can be accurately calculated by using the thermal resistance matrix. This paper focused on thermal coupling effect and presented heat conduction routes and thermal resistance model of three different MCM (lateral-chip, stacked-chip and lateral-and-stacked chip). Based on linear superposition theory, the thermal resistance matrix was established by FEA simulation, the model of calculating junction temperature was obtained by thermal resistance matrix. The model was verified by infrared thermal imaging equipment and the relative error was less than 2%.
Keywords
finite element analysis; heat conduction; multichip modules; thermal resistance; FEA simulation; heat conduction routes; high density assembly; infrared thermal imaging equipment; junction temperature; lateral-and-stacked chip; lateral-chip; linear superposition theory; multichip module; multiheat sources MCM; self-heating effect; stacked-chip; thermal coupling effects; thermal resistance matrix; Couplings; Heating; Junctions; Thermal analysis; Thermal conductivity; Thermal resistance; MCM; infrared thermal imaging; thermal coupling; thermal resistance matrix; thermal resistance model;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability, Maintainability and Safety (ICRMS), 2014 International Conference on
Print_ISBN
978-1-4799-6631-8
Type
conf
DOI
10.1109/ICRMS.2014.7107291
Filename
7107291
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